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Transmission Electron Microscopy |
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Transmission Electron Microscopy |
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Transmission Electron Microscopy |
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Analysis Software |
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[Peak-Pairs Analysis (PPA)]
Maker: HREM Research Inc. and originally
developed by Pedro L. Galindo of Univ. of Cadiz
Feature: DM Plug-in for peak intensity analysis and
local strain map calculation from standard HREM images.
More Information: https://www.hremresearch.com/ppa/
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Analysis Software |
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[Geometrical Phase Analysis (GPA)]
Maker: HREM Research Inc.
Feature: DM Plug-in for generating fully
quantitative deformation and 2-D strain maps from standard high-resolution
(S)TEM images.
More Information: https://www.hremresearch.com/gpa/
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Analysis Software |
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Analysis Software |
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Analysis Software |
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Image Simulator |
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Image Simulator |
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Image Simulator |
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[JEMS]
Feature: A program for simulating images and diffraction patterns in electron microscopy
More Information:
https://www.jems-swiss.ch/
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In-situ TEM holder |
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[DENS solution TEM holder & Nano chips]
Maker & Model:
DENS solution,lightening (In-situ TEM Heating & Biasing)
Feature: 8-pin holder, Biasing or heating, 4
point
contacts, alpha & beta tilt
More Information:
http://denssolutions.com/products/lightning/nano-chip/ Biasing&Heating chip Biasing chip Heating chip
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In-situ TEM holder |
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In-situ TEM holder |
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In-situ TEM holder |
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[Nanofactory STM TEM Holder]
Maker & Model: Nanofactory, STM-TEM
Feature: STM-TEM imaging, in-situ
electrical characterization More information: Nanofactory_STM-TEM_Brochure.pdf
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In-situ TEM holder |
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[Nanofactory Nanoindentation Holder]
Maker & Model: Nanofactory, TEM-Nanoindenter
Feature: in-situ force and displacement
measurements, observation of the stress/strain-induced structural changes More information: Nanofactory_TEM-Nanoindenter_Brochure.pdf
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TEM sample preparation |
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TEM sample preparation |
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TEM sample preparation |
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